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Tests, measurements, and characterization of electro-optic devices and systems : proceedings / [edited by] Shekhar G. Wadekar.

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Material type: Text

Text

TextSeries: SPIE proceedings series ; vol. 1180Publication details: Bellingham, Washington : SPIE, 1989.Description: vi, 196 p. : illISBN:

0819402168

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Holdings
Item type	Current library	Collection	Call number	Status	Notes	Date due	Barcode
Books	Matheson Library	Main Collection	623.7314 T345 (Browse shelf(Opens below))	Available	Recat.		081340

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