Tests, measurements, and characterization of electro-optic devices and systems : proceedings /
Tests, measurements, and characterization of electro-optic devices and systems : proceedings /
[edited by] Shekhar G. Wadekar.
- Bellingham, Washington : SPIE, 1989.
- vi, 196 p. : ill.
- SPIE proceedings series ; vol. 1180 .
0819402168
Electrooptical devices--Measurement--Conference proceedings.
Electrooptics--Measurement--Conference proceedings.
0819402168
Electrooptical devices--Measurement--Conference proceedings.
Electrooptics--Measurement--Conference proceedings.