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Digital integrated circuit testing from a quality perspective / Eugene R. Hnatek.

By:

Hnatek, Eugene R

Material type: Text

Text

TextPublication details: New York : Van Nostrand Reinhold, c1993.Description: x, 179 p. : illISBN:

0442006438

Subject(s):

Digital integrated circuits -- Testing -- Quality control

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	Matheson Library	621.381548 H677 (Browse shelf(Opens below))	127		104219

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