Digital integrated circuit testing from a quality perspective /
Hnatek, Eugene R.
Digital integrated circuit testing from a quality perspective / Eugene R. Hnatek. - New York : Van Nostrand Reinhold, c1993. - x, 179 p. : ill.
0442006438
Digital integrated circuits--Testing--Quality control.
Digital integrated circuit testing from a quality perspective / Eugene R. Hnatek. - New York : Van Nostrand Reinhold, c1993. - x, 179 p. : ill.
0442006438
Digital integrated circuits--Testing--Quality control.