000 00521pam a2200169 a 4500
001 00232696
003 PWmBRO
005 20240602103803.0
008 941020s1993 nyua b 001 0 eng
020 _a0442006438
100 1 _aHnatek, Eugene R.
245 1 0 _aDigital integrated circuit testing from a quality perspective /
_cEugene R. Hnatek.
260 _aNew York :
_bVan Nostrand Reinhold,
_cc1993.
300 _ax, 179 p. :
_bill.
650 0 _aDigital integrated circuits
_xTesting
_xQuality control.
942 _2ddc
999 _c80880
_d80880