| 000 | 00952nam a2200265u 4500 | ||
|---|---|---|---|
| 001 | 00711888 | ||
| 003 | PWmBRO | ||
| 005 | 20240602101251.0 | ||
| 008 | 851202s1985 ilua 00000 eng | ||
| 020 | _a0915414856 (pbk.) | ||
| 039 | 0 |
_a2 _b3 _c3 _d3 _e3 |
|
| 090 | 0 | _b620.004/4/M271e | |
| 100 | 1 | 0 | _aMandel, C. E. |
| 245 | 1 | 0 |
_aEnvironmental stress screening : _ba tutorial. |
| 260 | 0 |
_a[Mount Prospect, IL] : _bInstitute of Environmental Sciences, _c[c1985] |
|
| 300 |
_aiv, 107 p. : _bill. |
||
| 505 | 0 | _aFundamentals of environmental stress screening / C. E. (Neil) Mandel, Jr. -- Defect related failure mechanisms in electronic materials accelerated during environmental stress screening / B. R. Livesay. | |
| 650 | 0 | _aEnvironmental testing. | |
| 650 | 0 | _aReliability (Engineering) | |
| 700 | 1 | 0 | _aLivesay, B. R. |
| 710 | 2 | 0 | _aInstitute of Environmental Sciences. |
| 942 | _2ddc | ||
| 994 | 0 | 1 | _aT1001 056 652 |
| 999 |
_c39568 _d39568 |
||