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Rational fault analysis edited by Richard Saeks, Stanley R. Liberty

By: Contributor(s): Material type: TextTextSeries: Electrical engineering and electronics ; 1Publication details: New York M. Dekker c1977Description: ix, 241 p. ill. 24 cmSubject(s): DDC classification:
  • 621.3815 1 028
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Item type Current library Collection Call number Status Date due Barcode
Books Books Matheson Library Main Collection Main Collection 621.38151028 S989r (Browse shelf(Opens below)) Available 013733

Co-sponsored by the Office of Naval Research and the Army Research Office

"This volume represents the proceedings of the Symposium on Rational Fault Analysis held at Texas Tech University August19-20, 1974".

0824765419

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