Details for: Thin-film and depth-profile analysis › Matheson Library catalog

Matheson Library

Empowering Knowledge, Inspiring Discovery

Welcome to the Matheson Library

Explore our vast collection of resources.

Learn and Grow

Your journey to knowledge starts here.

Connect with Us

Join the Matlis community for lifelong learning.

Discover New Worlds

Books that inspire and empower.

Digital Resources

Access journals, articles, and more.

Collaborate and Innovate

Spaces designed for teamwork.

Events and Workshops

Learn from experts and peers.

History and Heritage

Preserving stories and memories.

Our Mission

Empowering education for all.

Future Ready

Building knowledge for tomorrow.

Normal view MARC view ISBD view

Thin-film and depth-profile analysis edited by H. Oechsner with contributions by H.W. Etzkorn ... [et al.]

Contributor(s):

Material type: Text

Text

TextSeries: Topics in current physics ; 37Publication details: Berlin New York Springer-Verlag 1984Description: xi, 205 pSubject(s):

DDC classification:

530.4 1

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	Matheson Library Main Collection	Main Collection	530.41 T443 (Browse shelf(Opens below))	Available		044449

3540133208

There are no comments on this title.

to post a comment.

Share