Hnatek, Eugene R. <br/><br/>
Digital integrated circuit testing from a quality perspective / 
Eugene R. Hnatek. 
 - New York :  Van Nostrand Reinhold,  c1993. 
 - x, 179 p. :  ill. 
<br/><br/><label>ISBN: </label>0442006438 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits--Testing--Quality control.