Tests, measurements, and characterization of electro-optic devices and systems :  proceedings / 
[edited by] Shekhar G. Wadekar. 
 - Bellingham, Washington :  SPIE,  1989. 
 - vi, 196 p. : ill. 
 - SPIE proceedings series ; vol. 1180 .
<br/><br/><label>ISBN: </label>0819402168 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrooptical devices--Measurement--Conference proceedings.<br/>Electrooptics--Measurement--Conference proceedings.