TY  - BOOK
AU  - Amerasekera,E.A.
AU  - Campbell,D.S.
TI  - Failure mechanisms in semiconductor devices
SN  - 0471914347 :
AV  - TK7871.85 .A49 1987
U1  - 621.3815/2�19 
PY  - 1987///
CY  - Chichester, New York
PB  - Wiley
KW  - Semiconductors
KW  - Failures
ER  -