Characterization and behavior of materials with submicron dimensions :  proceedings from the conference sponsored by the TMS Committee on Alloy Phases and the Electrical, Magnetic, and Optical Phenomena Activity Group of the MSD of ASM / 
edited by James T. Waber. 
 - Singapore :  World Scientific,  1985. 
 - xii, 205 p. :  ill. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Miniature electronic equipment.<br/>Microelectronics.<br/>Microstructure.