Practical scanning electron microscopy  electron and ion microprobe analysis forward by T. E. Everhart 
edited by Joseph I. Goldstein and Harvey Yakowitz 
 - New York  Plenum Press  1975 
 - xviii, 582 p.  ill.  24 cm. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microprobe analysis<br/>Scanning electron microscopes
<br/><br/><label>Dewey Class. No.: </label>502  / .8