Heinrich, Kurt F. J. <br/><br/>
Electron beam x-ray microanalysis 
Kurt F. J. Heinrich 
 - New York  Van Nostrand Reinhold Co.  c1981 
 - xxiii, 578 p., [4] leaves of plates  ill.  24 cm. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron probe microanalysis<br/>X-ray spectroscopy
<br/><br/><label>Dewey Class. No.: </label>543  / .0812