Rational fault analysis 
edited by Richard Saeks, Stanley R. Liberty 
 - New York  M. Dekker  c1977 
 - ix, 241 p.  ill.  24 cm. 
 - Electrical engineering and electronics  1 .
<br/><br/> Co-sponsored by the Office of Naval Research and the Army Research Office 
<br/><br/> "This volume represents the proceedings of the Symposium on Rational Fault Analysis held at Texas Tech University August19-20, 1974". 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic apparatus and appliances--Testing<br/>Electronic apparatus and appliances--Reliability<br/>Automatic checkout equipment
<br/><br/><label>Dewey Class. No.: </label>621.3815  / 1  / 028