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Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

By:

Abramovici, Miron

Contributor(s):

Material type: Text

Text

TextSeries: Electrical engineering communications and signal processing seriesPublication details: New York, NY : Computer Science Press, c1990.Description: xxi, 653 p. : illISBN:

0716781794

Subject(s):

DDC classification:

621.3/815/A161

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	Matheson Library Main Collection	Main Collection	621.3815 A161 (Browse shelf(Opens below))	127		091803

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Previous	621.38137 K68m Microwave measurement by comparison methods /	621.38137 L399h Handbook of microwave testing	621.3815 3 The interface circuits data book for design engineers	621.3815 A161 Digital systems testing and testable design /	621.3815 A286 Electronics for engineers : an introduction /	621.3815 A584 Electronic circuits : a unified treatment of vacuum tubes and transistors /	621.3815 B637 Digital design with standard MSI and LIS : design techniques for the microcomptuer age /	Next

Includes bibliographical references (p. 644-645) and index.

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