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Defects and radiation effects in semiconductors, 1980 : (Record no. 33723)

MARC details
000 -LEADER
fixed length control field 00863nam a2200181 a 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20240602100921.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 040531s19uu xx 00 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0854981500
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Hasiguti, R. R.
245 #0 - TITLE STATEMENT
Title Defects and radiation effects in semiconductors, 1980 :
Remainder of title invited and contributed papers from the Eleventh International Conference on Defects and Radiation Effects in Semiconductors held in Oiso, Japan, 8-11 September 1980 /
Statement of responsibility, etc. edited by R.R Hasiguti.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Bristol, UK :
Name of publisher, distributor, etc. The Institute of Physics,
Date of publication, distribution, etc. c1981.
300 ## - PHYSICAL DESCRIPTION
Extent xiv, 571 p. : ill.
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Institute of Physics Conference series; no. 59
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductors
General subdivision Defects.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductors
General subdivision Effect of radiation on.
711 1# - ADDED ENTRY--MEETING NAME
Meeting name or jurisdiction name as entry element International Conference on Defects and Radiation Effects in Semiconductors (11th : 1980 : Oiso, Japan).
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection Home library Current library Shelving location Date acquired Total checkouts Full call number Barcode Date last seen Price effective from Koha item type Public note
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