Digital systems testing and testable design /
Abramovici, Miron.
Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. - New York, NY : Computer Science Press, c1990. - xxi, 653 p. : ill. - Electrical engineering, communications, and signal processing . - Electrical engineering communications and signal processing series. .
Includes bibliographical references (p. 644-645) and index.
0716781794
Digital integrated circuits--Testing.
Digital integrated circuits--Design and construction.
621.3/815/A161
Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. - New York, NY : Computer Science Press, c1990. - xxi, 653 p. : ill. - Electrical engineering, communications, and signal processing . - Electrical engineering communications and signal processing series. .
Includes bibliographical references (p. 644-645) and index.
0716781794
Digital integrated circuits--Testing.
Digital integrated circuits--Design and construction.
621.3/815/A161