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Electron beam x-ray microanalysis

Heinrich, Kurt F. J.

Electron beam x-ray microanalysis Kurt F. J. Heinrich - New York Van Nostrand Reinhold Co. c1981 - xxiii, 578 p., [4] leaves of plates ill. 24 cm.

Subjects--Topical Terms:
Electron probe microanalysis
X-ray spectroscopy

Dewey Class. No.: 543 / .0812

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